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Optical Materials Express

Optical Materials Express

  • Editor: David J. Hagan
  • Vol. 2, Iss. 7 — Jul. 1, 2012
  • pp: 914–919

Polarized Raman mapping method for estimation of refractive index differences on grain-boundaries and in-line transmission properties of polycrystalline alumina

T. Hayakawa, S. Hayashi, S. Miyazawa, T. Ohashi, and K. Watanabe  »View Author Affiliations

Optical Materials Express, Vol. 2, Issue 7, pp. 914-919 (2012)

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In this study, polarized Raman mapping technique was applied to determine the orientations of c-axis of each grain in translucent polycrystalline alumina (PCA) samples which were well-sintered in H2 atmosphere. The averaged refractive index difference Δnavg between neighboring alumina grain particles was then experimentally estimated from the mapping data. It was shown that the translucent alumina had Δnavg of 0.002 and 0.0015 for horizontal and side planes, respectively, smaller than the value for random orientation in the Apetz et al model (ΔnApetz = 0.0053). With the experimental value, then light transmission spectra was simulated in the scope of the well-known Rayleigh-Gans-Debye (RGD) theory.

© 2012 OSA

OCIS Codes
(120.7000) Instrumentation, measurement, and metrology : Transmission
(290.3030) Scattering : Index measurements
(290.5860) Scattering : Scattering, Raman

ToC Category:

Original Manuscript: April 16, 2012
Revised Manuscript: May 19, 2012
Manuscript Accepted: May 20, 2012
Published: June 12, 2012

Virtual Issues
Advances in Optical Materials (2012) Optical Materials Express

T. Hayakawa, S. Hayashi, S. Miyazawa, T. Ohashi, and K. Watanabe, "Polarized Raman mapping method for estimation of refractive index differences on grain-boundaries and in-line transmission properties of polycrystalline alumina," Opt. Mater. Express 2, 914-919 (2012)

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