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Optical Materials Express

Optical Materials Express

  • Editor: David J. Hagan
  • Vol. 2, Iss. 9 — Sep. 1, 2012
  • pp: 1270–1277

Photoluminescence in Er-doped Ge-As-Se chalcogenide thin films

Kunlun Yan, Rongping Wang, Khu Vu, Steve Madden, Kidane Belay, Robert Elliman, and Barry Luther-Davies  »View Author Affiliations


Optical Materials Express, Vol. 2, Issue 9, pp. 1270-1277 (2012)
http://dx.doi.org/10.1364/OME.2.001270


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Abstract

We report the properties of thermally evaporated Ge11.5As24Se64.5 chalcogenide films ion implanted at energies of 2.25MeV with Erbium at concentrations up to 0.4 mol%. The effect of post implant annealing on the refractive index of the films and on the 4I13/24I15/2 Er transition was studied. Photoluminescence was found to increase significantly and a lifetime of 1.35 ms was obtained in films annealed at 180°C. Different apparent lifetimes for the 4I13/24I15/2 transition were obtained for 980nm and 1470nm pumps and the origins of this phenomenon are discussed.

© 2012 OSA

OCIS Codes
(160.4330) Materials : Nonlinear optical materials
(160.5690) Materials : Rare-earth-doped materials
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Laser Materials

History
Original Manuscript: July 10, 2012
Revised Manuscript: August 7, 2012
Manuscript Accepted: August 7, 2012
Published: August 20, 2012

Citation
Kunlun Yan, Rongping Wang, Khu Vu, Steve Madden, Kidane Belay, Robert Elliman, and Barry Luther-Davies, "Photoluminescence in Er-doped Ge-As-Se chalcogenide thin films," Opt. Mater. Express 2, 1270-1277 (2012)
http://www.opticsinfobase.org/ome/abstract.cfm?URI=ome-2-9-1270


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