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Limit to the erbium ions emission in silicon-rich oxide films by erbium ion clusteringNikola Prtljaga, Daniel Navarro-Urrios, Andrea Tengattini, Aleksei Anopchenko, Joan Manel Ramírez, José Manuel Rebled, Sònia Estradé, Jean-Philippe Colonna, Jean-Marc Fedeli, Blas Garrido, and Lorenzo Pavesi »View Author Affiliations
Nikola Prtljaga,1,*
Daniel Navarro-Urrios,2
Andrea Tengattini,1
Aleksei Anopchenko,1
Joan Manel Ramírez,3
José Manuel Rebled,3,4
Sònia Estradé,3,5
Jean-Philippe Colonna,6
Jean-Marc Fedeli,6
Blas Garrido,3
and Lorenzo Pavesi1
1NanoScience Lab, Department of Physics, University of Trento, Via Sommarive 14, 38123 Povo, Trento, Italy 2Catalan Institute of Nanotechnology (CIN2-CSIC), Campus UAB, Edifici CM3, 08193 Bellaterra, Spain 3MIND–IN2UB, Departament D’Electrònica, Universitat de Barcelona, Carrer Martí i Franquès, 08 028 Barcelona, Spain 4Barcelona Materials Science Institute (ICMAB), CSIC, Campus UAB, Bellaterra 08193, Spain 5TEM-MAT, Scientific and Technological Centers, (CCiT), Universitat de Barcelona, Carrer Martí i Franquès, 08 028 Barcelona, Spain 6CEA/Léti, Minatec 17 rue des Martyrs, 38054 Grenoble cedex 9, France *Corresponding author: nikolap@science.unitn.it |
Optical Materials Express, Vol. 2, Issue 9, pp. 1278-1285 (2012)
http://dx.doi.org/10.1364/OME.2.001278
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Abstract
We have fabricated a series of thin (~50 nm) erbium-doped (by ion implantation) silicon-rich oxide films in the configuration that mitigates previously proposed mechanisms for loss of light emission capability of erbium ions. By combining the methods of optical, structural and electrical analysis, we identify the erbium ion clustering as a driving mechanism to low optical performance of this material. Experimental findings in this work clearly evidence inadequacy of the commonly employed optimization procedure when optical amplification is considered. We reveal that the significantly lower erbium ion concentrations are to be used in order to fully exploit the potential of this approach and achieve net optical gain.
© 2012 OSA
OCIS Codes
(130.3130) Integrated optics : Integrated optics materials
(160.5690) Materials : Rare-earth-doped materials
(250.5230) Optoelectronics : Photoluminescence
(310.6860) Thin films : Thin films, optical properties
ToC Category:
Laser Materials
History
Original Manuscript: June 21, 2012
Revised Manuscript: August 8, 2012
Manuscript Accepted: August 8, 2012
Published: August 21, 2012
Citation
Nikola Prtljaga, Daniel Navarro-Urrios, Andrea Tengattini, Aleksei Anopchenko, Joan Manel Ramírez, José Manuel Rebled, Sònia Estradé, Jean-Philippe Colonna, Jean-Marc Fedeli, Blas Garrido, and Lorenzo Pavesi, "Limit to the erbium ions emission in silicon-rich oxide films by erbium ion clustering," Opt. Mater. Express 2, 1278-1285 (2012)
http://www.opticsinfobase.org/ome/abstract.cfm?URI=ome-2-9-1278
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- I. F. Crowe, R. J. Kashtiban, B. Sherliker, U. Bangert, M. P. Halsall, A. P. Knights, and R. M. Gwilliam, “Spatially correlated erbium and Si nanocrystals in coimplanted SiO2 after a single high temperature anneal,” J. Appl. Phys.107(4), 044316 (2010). [CrossRef]
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- S. Cueff, C. Labbé, O. Jambois, B. Garrido, X. Portier, and R. Rizk, “Thickness-dependent optimization of Er3+ light emission from silicon-rich silicon oxide thin films,” Nanoscale Res. Lett.6(1), 395 (2011). [CrossRef] [PubMed]
- C. Maurizio, F. Iacona, F. D’Acapito, G. Franzò, and F. Priolo, “Er site in Er-implanted Si nanoclusters embedded in SiO2,” Phys. Rev. B74(20), 205428 (2006). [CrossRef]
- D. Navarro-Urrios, F. Ferrarese Lupi, N. Prtljaga, A. Pitanti, O. Jambois, J. M. Ramírez, Y. Berencén, N. Daldosso, B. Garrido, and L. Pavesi, “Copropagating pump and probe experiments on Si-nc in SiO2 rib waveguides doped with Er: the optical role of non-emitting ions,” Appl. Phys. Lett.99(23), 231114 (2011). [CrossRef]
- D. Navarro-Urrios, Y. Lebour, O. Jambois, B. Garrido, A. Pitanti, N. Daldosso, L. Pavesi, J. Cardin, K. Hijazi, L. Khomenkova, F. Gourbilleau, and R. Rizk, “Optically active Er3+ ions in SiO2 codoped with Si nanoclusters,” J. Appl. Phys.106(9), 093107 (2009). [CrossRef]
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- B. Garrido, C. García, P. Pellegrino, D. Navarro-Urrios, N. Daldosso, L. Pavesi, F. Gourbilleau, and R. Rizk, “Distance dependent interaction as the limiting factor for Si nanocluster to Er energy transfer in silica,” Appl. Phys. Lett.89(16), 163103 (2006). [CrossRef]
- N. Daldosso, D. Navarro-Urrios, M. Melchiorri, L. Pavesi, C. Sada, F. Gourbilleau, and R. Rizk, “Refractive index dependence of the absorption and emission cross sections at 1.54 μm of Er3+ coupled to Si nanoclusters,” Appl. Phys. Lett.88(16), 161901 (2006). [CrossRef]
- N. Daldosso, D. Navarro-Urrios, M. Melchiorri, L. Pavesi, F. Gourbilleau, M. Carrada, R. Rizk, C. García, P. Pellegrino, B. Garrido, and L. Cognolato, “Absorption cross section and signal enhancement in Er-doped Si nanocluster rib-loaded waveguides,” Appl. Phys. Lett.86(26), 261103 (2005). [CrossRef]
- M. de Dood, L. Slooff, A. Polman, A. Moroz, and A. van Blaaderen, “Local optical density of states in SiO2 spherical microcavities: theory and experiment,” Phys. Rev. A64(3), 033807 (2001). [CrossRef]
- S. Minissale, T. Gregorkiewicz, M. Forcales, and R. G. Elliman, “On optical activity of Er3+ ions in Si-rich SiO2 waveguides,” Appl. Phys. Lett.89(17), 171908 (2006). [CrossRef]
- A. Anopchenko, A. Tengattini, A. Marconi, N. Prtljaga, J. M. Ramírez, O. Jambois, Y. Berencén, D. Navarro-Urrios, B. Garrido, F. Milesi, J.-P. Colonna, J.-M. Fedeli, and L. Pavesi, “Bipolar pulsed excitation of erbium-doped nanosilicon light emitting diodes,” J. Appl. Phys.111(6), 063102 (2012). [CrossRef]
- D. Navarro-Urrios, F. Ferrarese Lupi, N. Prtljaga, A. Pitanti, O. Jambois, J. M. Ramírez, Y. Berencén, N. Daldosso, B. Garrido, and L. Pavesi, “Copropagating pump and probe experiments on Si-nc in SiO2 rib waveguides doped with Er: the optical role of non-emitting ions,” Appl. Phys. Lett.99(23), 231114 (2011). [CrossRef]
- S. Minissale, T. Gregorkiewicz, M. Forcales, and R. G. Elliman, “On optical activity of Er3+ ions in Si-rich SiO2 waveguides,” Appl. Phys. Lett.89(17), 171908 (2006). [CrossRef]
- M. Wojdak, M. Klik, M. Forcales, O. Gusev, T. Gregorkiewicz, D. Pacifici, G. Franzò, F. Priolo, and F. Iacona, “Sensitization of Er luminescence by Si nanoclusters,” Phys. Rev. B69(23), 233315 (2004). [CrossRef]
- G. Franzò, M. Miritello, S. Boninelli, R. Lo Savio, M. G. Grimaldi, F. Priolo, F. Iacona, G. Nicotra, C. Spinella, and S. Coffa, “Microstructural evolution of SiOx films and its effect on the luminescence of Si nanoclusters,” J. Appl. Phys.104(9), 094306 (2008). [CrossRef]
- G. Franzò, E. Pecora, F. Priolo, and F. Iacona, “Role of the Si excess on the excitation of Er doped SiOx,” Appl. Phys. Lett.90(18), 183102 (2007). [CrossRef]
- C. Maurizio, F. Iacona, F. D’Acapito, G. Franzò, and F. Priolo, “Er site in Er-implanted Si nanoclusters embedded in SiO2,” Phys. Rev. B74(20), 205428 (2006). [CrossRef]
- M. Wojdak, M. Klik, M. Forcales, O. Gusev, T. Gregorkiewicz, D. Pacifici, G. Franzò, F. Priolo, and F. Iacona, “Sensitization of Er luminescence by Si nanoclusters,” Phys. Rev. B69(23), 233315 (2004). [CrossRef]
- G. Franzò, S. Boninelli, D. Pacifici, F. Priolo, F. Iacona, and C. Bongiorno, “Sensitizing properties of amorphous Si clusters on the 1.54-μm luminescence of Er in Si-rich SiO2,” Appl. Phys. Lett.82(22), 3871–3873 (2003). [CrossRef]
- F. Priolo, G. Franzò, D. Pacifici, V. Vinciguerra, F. Iacona, and A. Irrera, “Role of the energy transfer in the optical properties of undoped and Er-doped interacting Si nanocrystals,” J. Appl. Phys.89(1), 264–272 (2001). [CrossRef]
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Appl. Phys. Lett.
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J. Mol. Model.
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J. Opt. Soc. Am. B
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Nat. Photonics
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Opt. Express
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Phys. Rev.
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Phys. Rev. A
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Phys. Rev. B
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Phys. Rev. Lett.
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2012, Anopchenko, J. Appl. Phys.
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- L. Borowska, S. Fritzsche, P. G. Kik, and A. E. Masunov, “Near-field enhancement of infrared intensities for f-f transitions in Er3+ ions close to the surface of silicon nanoparticles,” J. Mol. Model.17(3), 423–428 (2011). [CrossRef] [PubMed]
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- S. Cueff, C. Labbé, O. Jambois, B. Garrido, X. Portier, and R. Rizk, “Thickness-dependent optimization of Er3+ light emission from silicon-rich silicon oxide thin films,” Nanoscale Res. Lett.6(1), 395 (2011). [CrossRef] [PubMed]
- D. Liang and J. E. Bowers, “Recent progress in lasers on silicon,” Nat. Photonics4(8), 511–517 (2010). [CrossRef]
- I. F. Crowe, R. J. Kashtiban, B. Sherliker, U. Bangert, M. P. Halsall, A. P. Knights, and R. M. Gwilliam, “Spatially correlated erbium and Si nanocrystals in coimplanted SiO2 after a single high temperature anneal,” J. Appl. Phys.107(4), 044316 (2010). [CrossRef]
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- C. Creatore, L. C. Andreani, M. Miritello, R. Lo Savio, and F. Priolo, “Modification of erbium radiative lifetime in planar silicon slot waveguides,” Appl. Phys. Lett.94(10), 103112 (2009). [CrossRef]
- I. Izeddin, D. Timmerman, T. Gregorkiewicz, A. Moskalenko, A. Prokofiev, I. Yassievich, and M. Fujii, “Energy transfer in Er-doped SiO2 sensitized with Si nanocrystals,” Phys. Rev. B78(3), 035327 (2008). [CrossRef]
- G. Franzò, M. Miritello, S. Boninelli, R. Lo Savio, M. G. Grimaldi, F. Priolo, F. Iacona, G. Nicotra, C. Spinella, and S. Coffa, “Microstructural evolution of SiOx films and its effect on the luminescence of Si nanoclusters,” J. Appl. Phys.104(9), 094306 (2008). [CrossRef]
- G. Franzò, E. Pecora, F. Priolo, and F. Iacona, “Role of the Si excess on the excitation of Er doped SiOx,” Appl. Phys. Lett.90(18), 183102 (2007). [CrossRef]
- B. Garrido, C. García, S.-Y. Seo, P. Pellegrino, D. Navarro-Urrios, N. Daldosso, L. Pavesi, F. Gourbilleau, and R. Rizk, “Excitable Er fraction and quenching phenomena in Er-doped SiO2 layers containing Si nanoclusters,” Phys. Rev. B76(24), 245308 (2007). [CrossRef]
- O. Savchyn, F. Ruhge, P. Kik, R. Todi, K. Coffey, H. Nukala, and H. Heinrich, “Luminescence-center-mediated excitation as the dominant Er sensitization mechanism in Er-doped silicon-rich SiO2 films,” Phys. Rev. B76(19), 195419 (2007). [CrossRef]
- I. Izeddin, A. S. Moskalenko, I. N. Yassievich, M. Fujii, and T. Gregorkiewicz, “Nanosecond dynamics of the near-infrared photoluminescence of Er-doped SiO2 sensitized with Si nanocrystals,” Phys. Rev. Lett.97(20), 207401 (2006). [CrossRef] [PubMed]
- C. J. Oton, W. H. Loh, and A. J. Kenyon, “Er3+ excited state absorption and the low fraction of nanocluster-excitable Er3+ in SiOx,” Appl. Phys. Lett.89(3), 031116 (2006). [CrossRef]
- B. Garrido, C. García, P. Pellegrino, D. Navarro-Urrios, N. Daldosso, L. Pavesi, F. Gourbilleau, and R. Rizk, “Distance dependent interaction as the limiting factor for Si nanocluster to Er energy transfer in silica,” Appl. Phys. Lett.89(16), 163103 (2006). [CrossRef]
- N. Daldosso, D. Navarro-Urrios, M. Melchiorri, L. Pavesi, C. Sada, F. Gourbilleau, and R. Rizk, “Refractive index dependence of the absorption and emission cross sections at 1.54 μm of Er3+ coupled to Si nanoclusters,” Appl. Phys. Lett.88(16), 161901 (2006). [CrossRef]
- C. Maurizio, F. Iacona, F. D’Acapito, G. Franzò, and F. Priolo, “Er site in Er-implanted Si nanoclusters embedded in SiO2,” Phys. Rev. B74(20), 205428 (2006). [CrossRef]
- S. Minissale, T. Gregorkiewicz, M. Forcales, and R. G. Elliman, “On optical activity of Er3+ ions in Si-rich SiO2 waveguides,” Appl. Phys. Lett.89(17), 171908 (2006). [CrossRef]
- P. Pellegrino, B. Garrido, J. Arbiol, C. Garcia, Y. Lebour, and J. R. Morante, “Site of Er ions in silica layers codoped with Si nanoclusters and Er,” Appl. Phys. Lett.88(12), 121915 (2006). [CrossRef]
- N. Daldosso, D. Navarro-Urrios, M. Melchiorri, L. Pavesi, F. Gourbilleau, M. Carrada, R. Rizk, C. García, P. Pellegrino, B. Garrido, and L. Cognolato, “Absorption cross section and signal enhancement in Er-doped Si nanocluster rib-loaded waveguides,” Appl. Phys. Lett.86(26), 261103 (2005). [CrossRef]
- F. Iacona, C. Bongiorno, C. Spinella, S. Boninelli, and F. Priolo, “Formation and evolution of luminescent Si nanoclusters produced by thermal annealing of SiOx films,” J. Appl. Phys.95(7), 3723–3732 (2004). [CrossRef]
- M. Wojdak, M. Klik, M. Forcales, O. Gusev, T. Gregorkiewicz, D. Pacifici, G. Franzò, F. Priolo, and F. Iacona, “Sensitization of Er luminescence by Si nanoclusters,” Phys. Rev. B69(23), 233315 (2004). [CrossRef]
- G. Franzò, S. Boninelli, D. Pacifici, F. Priolo, F. Iacona, and C. Bongiorno, “Sensitizing properties of amorphous Si clusters on the 1.54-μm luminescence of Er in Si-rich SiO2,” Appl. Phys. Lett.82(22), 3871–3873 (2003). [CrossRef]
- F. Priolo, G. Franzò, D. Pacifici, V. Vinciguerra, F. Iacona, and A. Irrera, “Role of the energy transfer in the optical properties of undoped and Er-doped interacting Si nanocrystals,” J. Appl. Phys.89(1), 264–272 (2001). [CrossRef]
- M. de Dood, L. Slooff, A. Polman, A. Moroz, and A. van Blaaderen, “Local optical density of states in SiO2 spherical microcavities: theory and experiment,” Phys. Rev. A64(3), 033807 (2001). [CrossRef]
- H. Urbach and G. Rikken, “Spontaneous emission from a dielectric slab,” Phys. Rev. A57(5), 3913–3930 (1998). [CrossRef]
- M. Fujii, M. Yoshida, Y. Kanzawa, S. Hayashi, and K. Yamamoto, “1.54 µm photoluminescence of Er3+ doped into SiO2 films containing Si nanocrystals: evidence for energy transfer from Si nanocrystals to Er3+,” Appl. Phys. Lett.71(9), 1198–1200 (1997). [CrossRef]
- E. Snoeks, A. Lagendijk, and A. Polman, “Measuring and modifying the spontaneous emission rate of erbium near an interface,” Phys. Rev. Lett.74(13), 2459–2462 (1995). [CrossRef] [PubMed]
- R. S. Quimby, W. J. Miniscalco, and B. Thompson, “Clustering in erbium-doped silica glass fibers analyzed using 980 nm excited-state absorption,” J. Appl. Phys.76(8), 4472–4478 (1994). [CrossRef]
- E. M. Purcell, “Spontaneous emission probabilities at radio frequencies,” Phys. Rev.69, 681 (1946).
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