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Optical Materials Express

Optical Materials Express

  • Editor: David J. Hagan
  • Vol. 2, Iss. 9 — Sep. 1, 2012
  • pp: 1278–1285

Limit to the erbium ions emission in silicon-rich oxide films by erbium ion clustering

Nikola Prtljaga, Daniel Navarro-Urrios, Andrea Tengattini, Aleksei Anopchenko, Joan Manel Ramírez, José Manuel Rebled, Sònia Estradé, Jean-Philippe Colonna, Jean-Marc Fedeli, Blas Garrido, and Lorenzo Pavesi  »View Author Affiliations


Optical Materials Express, Vol. 2, Issue 9, pp. 1278-1285 (2012)
http://dx.doi.org/10.1364/OME.2.001278


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Abstract

We have fabricated a series of thin (~50 nm) erbium-doped (by ion implantation) silicon-rich oxide films in the configuration that mitigates previously proposed mechanisms for loss of light emission capability of erbium ions. By combining the methods of optical, structural and electrical analysis, we identify the erbium ion clustering as a driving mechanism to low optical performance of this material. Experimental findings in this work clearly evidence inadequacy of the commonly employed optimization procedure when optical amplification is considered. We reveal that the significantly lower erbium ion concentrations are to be used in order to fully exploit the potential of this approach and achieve net optical gain.

© 2012 OSA

OCIS Codes
(130.3130) Integrated optics : Integrated optics materials
(160.5690) Materials : Rare-earth-doped materials
(250.5230) Optoelectronics : Photoluminescence
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Laser Materials

History
Original Manuscript: June 21, 2012
Revised Manuscript: August 8, 2012
Manuscript Accepted: August 8, 2012
Published: August 21, 2012

Citation
Nikola Prtljaga, Daniel Navarro-Urrios, Andrea Tengattini, Aleksei Anopchenko, Joan Manel Ramírez, José Manuel Rebled, Sònia Estradé, Jean-Philippe Colonna, Jean-Marc Fedeli, Blas Garrido, and Lorenzo Pavesi, "Limit to the erbium ions emission in silicon-rich oxide films by erbium ion clustering," Opt. Mater. Express 2, 1278-1285 (2012)
http://www.opticsinfobase.org/ome/abstract.cfm?URI=ome-2-9-1278


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