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Optical Materials Express

Optical Materials Express

  • Editor: David J. Hagan
  • Vol. 3, Iss. 9 — Sep. 1, 2013
  • pp: 1223–1232

Refractive index profiling of direct laser written waveguides: tomographic phase imaging

A. Jesacher, P. S. Salter, and M. J. Booth  »View Author Affiliations

Optical Materials Express, Vol. 3, Issue 9, pp. 1223-1232 (2013)

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We present a technique to measure the refractive index profile of direct laser written waveguides. This method has the potential for straightforward implementation in an existing laser fabrication system. Quantitative phase microscopy, based on the Transfer of Intensity equation, is used to analyse waveguides fabricated with an ultrashort pulsed laser embedded several hundred micron below the surface of fused silica. It is shown that the cumulative phase change induced by the waveguide perpendicular to its axis may be monitored in real-time during the fabrication process. Results are verified through comparison with interferometry. Tomographic measurements using illumination from a high numerical aperture condenser lens are used to infer the waveguide cross-section. Results are compared with measurements of the waveguide cross-section from a third harmonic generation microscope.

© 2013 osa

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(220.4000) Optical design and fabrication : Microstructure fabrication
(250.5300) Optoelectronics : Photonic integrated circuits
(130.2755) Integrated optics : Glass waveguides
(110.6955) Imaging systems : Tomographic imaging

ToC Category:
Laser Materials Processing

Original Manuscript: May 31, 2013
Revised Manuscript: July 11, 2013
Manuscript Accepted: July 12, 2013
Published: August 7, 2013

Virtual Issues
Ultrafast Laser Modification of Materials (2013) Optical Materials Express

A. Jesacher, P. S. Salter, and M. J. Booth, "Refractive index profiling of direct laser written waveguides: tomographic phase imaging," Opt. Mater. Express 3, 1223-1232 (2013)

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