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Optical Materials Express

Optical Materials Express

  • Editor: David J. Hagan
  • Vol. 3, Iss. 9 — Sep. 1, 2013
  • pp: 1397–1407

Investigation of metal sulfide optical thin film growth in low-loss IR hollow glass waveguides

Carlos M. Bledt, Jeffrey E. Melzer, and James A. Harrington  »View Author Affiliations

Optical Materials Express, Vol. 3, Issue 9, pp. 1397-1407 (2013)

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In this study, the film growth kinetics for near and mid-IR reflection enhancing CdS and PbS dielectric thin films in HGWs is experimentally established. Crucial fabrication parameters including solution concentrations, pH, and fluid velocity are optimized. The film thickness of these films in HGWs is studied as a function of deposition time and temperature. Through IR spectral response analysis, the dielectric thin film thicknesses were determined and found to have a strong linear time dependence. Accurate metal sulfide film growth models in HGWs were developed, allowing for direct determination of necessary deposition times to yield metal sulfide HGW thin film coatings having a desired response.

© 2013 OSA

OCIS Codes
(060.2390) Fiber optics and optical communications : Fiber optics, infrared
(310.0310) Thin films : Thin films
(310.1860) Thin films : Deposition and fabrication
(310.6860) Thin films : Thin films, optical properties
(350.4600) Other areas of optics : Optical engineering

ToC Category:
IR Materials

Original Manuscript: June 19, 2013
Revised Manuscript: July 29, 2013
Manuscript Accepted: August 8, 2013
Published: August 15, 2013

Virtual Issues
Mid-IR Photonic Materials (2013) Optical Materials Express

Carlos M. Bledt, Jeffrey E. Melzer, and James A. Harrington, "Investigation of metal sulfide optical thin film growth in low-loss IR hollow glass waveguides," Opt. Mater. Express 3, 1397-1407 (2013)

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