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Optical Materials Express

Optical Materials Express

  • Editor: David J. Hagan
  • Vol. 4, Iss. 2 — Feb. 1, 2014
  • pp: 403–410

Optical properties of Au-Ag alloys: An ellipsometric study

Ovidio Peña-Rodríguez, Magdalena Caro, Antonio Rivera, José Olivares, José Manuel Perlado, and Alfredo Caro  »View Author Affiliations

Optical Materials Express, Vol. 4, Issue 2, pp. 403-410 (2014)

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Optical properties of AgxAu1-x alloys were obtained experimentally using spectroscopic ellipsometry measurements on thin films fabricated by electron beam evaporation. Thin film thicknesses varied between 170 and 330 nm, making size effects negligible. Values of the complex refractive index of the pure metals were in good agreement with literature reports. The optical data set reported in this work can accurately reproduce experimental results. This is very important because there are not reliable and systematic optical constants for the alloys. Moreover, we show that the weighted average of the refractive indices of the pure metals fails to represent those of the alloys, not only in the region near the onset for interband transitions but also in the near-IR region.

© 2014 Optical Society of America

OCIS Codes
(160.4760) Materials : Optical properties
(240.0310) Optics at surfaces : Thin films
(240.6680) Optics at surfaces : Surface plasmons

ToC Category:
Thin Films

Original Manuscript: November 11, 2013
Revised Manuscript: January 7, 2014
Manuscript Accepted: January 2, 2014
Published: January 31, 2014

Ovidio Peña-Rodríguez, Magdalena Caro, Antonio Rivera, José Olivares, José Manuel Perlado, and Alfredo Caro, "Optical properties of Au-Ag alloys: An ellipsometric study," Opt. Mater. Express 4, 403-410 (2014)

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