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Optical Materials Express

Optical Materials Express

  • Editor: David Hagan
  • Vol. 4, Iss. 5 — May. 1, 2014
  • pp: 976–981

Measurement of charge density distributions in KTa1-xNbxO3 optical beam deflectors

Tadayuki Imai, Jun Miyazu, and Junya Kobayashi  »View Author Affiliations

Optical Materials Express, Vol. 4, Issue 5, pp. 976-981 (2014)

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In a KTa1-xNbxO3 optical beam deflector, light rays are bent by a space charge formed by electrons that are injected through an electrode and captured by crystal defects. For complete device control, it is important to evaluate the space charge. We propose an optical method for measuring charge density distributions that utilizes the electrooptic (EO) effect of the material. With this method, electron accumulation caused by a screening effect was commonly observed near the cathode. The electron accumulation region extended toward the anode as the applied voltage and permittivity increased. This method can be applied to any EO materials that exhibit space charge distributions.

© 2014 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(160.2100) Materials : Electro-optical materials
(250.0250) Optoelectronics : Optoelectronics

ToC Category:
Electro-optical Materials

Original Manuscript: November 26, 2013
Revised Manuscript: March 15, 2014
Manuscript Accepted: March 19, 2014
Published: April 15, 2014

Tadayuki Imai, Jun Miyazu, and Junya Kobayashi, "Measurement of charge density distributions in KTa1-xNbxO3 optical beam deflectors," Opt. Mater. Express 4, 976-981 (2014)

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