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Optical Materials Express

Optical Materials Express

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Microscopy : Near-field microscopy


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  • JOSA A, Vol. 31, Issue 7, pp. 1627-1635 (July 2014)
  • Lasse-Petteri Leppänen, Ari T. Friberg, Tero Setälä

  • Optics Letters, Vol. 39, Issue 16, pp. 4800-4803 (August 2014)
  • C. H. van Hoorn, D. C. Chavan, B. Tiribilli, G. Margheri, A. J. G. Mank, F. Ariese, D. Iannuzzi

  • Optics Letters, Vol. 39, Issue 19, pp. 5744-5747 (October 2014)
  • Priyamvada Venugopalan, Qiming Zhang, Xiangping Li, L. Kuipers, Min Gu

  • Optics Letters, Vol. 39, Issue 20, pp. 5838-5841 (October 2014)
  • Eunsung Seo, Joonmo Ahn, Wonjun Choi, Hakjoon Lee, Young Min Jhon, Sanghoon Lee, Wonshik Choi

  • Optics Letters, Vol. 39, Issue 20, pp. 5961-5964 (October 2014)
  • Xiangping Li, Priyamvada Venugopalan, Haoran Ren, Minghui Hong, Min Gu

  • Optics Letters, Vol. 39, Issue 21, pp. 6138-6141 (November 2014)
  • Jan Wallauer, Christian Grumber, Markus Walther

  • Optics Express, Vol. 22, Issue 12, pp. 14830-14839 (June 2014)
  • Nurrul Syafawati Binti Humam, Yu Sato, Motoki Takahashi, Shohei Kanazawa, Nobuhiro Tsumori, Philippe Regreny, Michel Gendry, Toshiharu Saiki

  • Optics Express, Vol. 22, Issue 13, pp. 16645-16659 (June 2014)
  • Jeffrey D’ Archangel, Eric Tucker, Markus B. Raschke, Glenn Boreman

  • Optics Express, Vol. 22, Issue 15, pp. 17948-17958 (July 2014)
  • Peter Hermann, Arne Hoehl, Georg Ulrich, Claudia Fleischmann, Antje Hermelink, Bernd Kästner, Piotr Patoka, Andrea Hornemann, Burkhard Beckhoff, Eckart Rühl, Gerhard Ulm

  • Optics Express, Vol. 22, Issue 15, pp. 18715-18723 (July 2014)
  • Nan Zhou, Yan Li, Xianfan Xu

  • Optics Express, Vol. 22, Issue 17, pp. 20432-20445 (August 2014)
  • Evgene D. Chubchev, Yulia V. Vladimirova, Victor N. Zadkov

  • Optics Express, Vol. 22, Issue 18, pp. 22232-22245 (September 2014)
  • A. Al Mohtar, J. Vaillant, Z. Sedaghat, M. Kazan, L. Joly, C. Stoeffler, J. Cousin, A. Khoury, A. Bruyant

  • Optics Express, Vol. 22, Issue 19, pp. 22369-22381 (September 2014)
  • Stefanie Bensmann, Fabian Gaußmann, Martin Lewin, Jochen Wüppen, Sebastian Nyga, Christoph Janzen, Bernd Jungbluth, Thomas Taubner

  • Optics Express, Vol. 22, Issue 19, pp. 23034-23042 (September 2014)
  • Oleg Mitrofanov, Filip Dominec, Petr Kužel, John L. Reno, Igal Brener, U-Chan Chung, Cathy Elissalde, Mario Maglione, Patrick Mounaix

  • Optics Express, Vol. 22, Issue 19, pp. 23372-23378 (September 2014)
  • Aiping Liu, Chang-Ling Zou, Xifeng Ren, Xiao Xiong, Yong-Jing Cai, Haitao Liu, Fang-Wen Sun, Guang-Can Guo, Guo-Ping Guo

  • Optics Express, Vol. 22, Issue 20, pp. 24096-24103 (October 2014)
  • Bofeng Zhu, Guobin Ren, Yixiao Gao, Yang Yang, Yudong Lian, Shuisheng Jian

  • Optics Express, Vol. 22, Issue 21, pp. 26438-26448 (October 2014)
  • A. V. Ankudinov, M. L. Yanul, S. O. Slipchenko, A. V. Shelaev, P. S. Dorozhkin, A. A. Podoskin, I. S. Tarasov

  • Optics Express, Vol. 22, Issue 22, pp. 26621-26634 (November 2014)
  • Bradley Deutsch, Martin Schnell, Rainer Hillenbrand, P. Scott Carney

  • Applied Optics, Vol. 53, Issue 24, pp. 5322-5329 (August 2014)
  • Victor V. Kotlyar, Sergey S. Stafeev, Alexander Feldman

  • Applied Optics, Vol. 53, Issue 26, pp. 6096-6102 (September 2014)
  • Md Ibrahim Khalil, Md Saad-Bin-Alam, Atiqur Rahman, Pavel A. Belov
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