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Optical Materials Express

Optical Materials Express

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  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1717–1724 (2014)
  • Hui Feng Ma, Gui Zhen Wang, Gu Sheng Kong, and Tie Jun Cui
  • Published on: 07/30/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1708–1716 (2014)
  • Mykhaylo Dubov, Sonia Boscolo, and David J. Webb
  • Published on: 07/24/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1668–1682 (2014)
  • Benjamin A. Kowalski, Adam C. Urness, Martha-Elizabeth Baylor, Michael C. Cole, William L. Wilson, and Robert R. McLeod
  • Published on: 07/22/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1683–1695 (2014)
  • D. Di Francesca, A. Boukenter, S. Agnello, S. Girard, A. Alessi, P. Paillet, C. Marcandella, N. Richard, F.M. Gelardi, and Y. Ouerdane
  • Published on: 07/22/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1696–1707 (2014)
  • Olaf Stenzel, Steffen Wilbrandt, Shan Du, Christian Franke, Norbert Kaiser, Andreas Tünnermann, Mathias Mende, Henrik Ehlers, and Mario Held
  • Published on: 07/22/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1641–1656 (2014)
  • Daniel Franta, David Necas, Lenka Zajícková, and Ivan Ohlídal
  • Published on: 07/21/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1657–1667 (2014)
  • Guan-Jhong Lin, Tien-Jung Chen, Bo-Yu Chen, Jin-Jei Wu, and Ying-Jay Yang
  • Published on: 07/21/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1632–1640 (2014)
  • B. C. Lin, C. H. Chiu, C. Y. Lee, H. V. Han, P. M. Tu, T. P. Chen, Z. Y. Li, P. T. Lee, C. C. Lin, G. C. Chi, C. H. Chen, B. Fan, C. Y. Chang, and H. C. Kuo
  • Published on: 07/17/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1601–1616 (2014)
  • Albertas Žukauskas, Gintare Bataviciute, Mindaugas Šciuka, Tomas Jukna, Andrius Melninkaitis, and Mangirdas Malinauskas
  • Published on: 07/16/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1617–1631 (2014)
  • C. Vigreux, M. Vu Thi, G. Maulion, R. Kribich, M. Barillot, V. Kirschner, and A. Pradel
  • Published on: 07/16/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1593–1600 (2014)
  • Chi-Jie Wang, Shih-Chang Shei, and Shoou-Jinn Chang
  • Published on: 07/15/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1586–1592 (2014)
  • Fabian D. J. Brunner, Seung-Heon Lee, O-Pil Kwon, and Thomas Feurer
  • Published on: 07/14/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1574–1585 (2014)
  • Martina Stoica, Guilherme Nunes Braga Maurício de Macedo, and Christian Rüssel
  • Published on: 07/11/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1564–1573 (2014)
  • Katsura Ikemiya, Kuniaki Konishi, Eiko Fujii, Toshihiro Kogure, Makoto Kuwata-Gonokami, and Tetsuya Hasegawa
  • Published on: 07/10/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1555–1563 (2014)
  • Ja-Hon Lin and Ying-Li Hsiao
  • Published on: 07/09/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1545–1554 (2014)
  • Hua Zou, Jun Li, Xusheng Wang, Dengfeng Peng, Yanxia Li, and Xi Yao
  • Published on: 07/07/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1505–1514 (2014)
  • A. Aghajani, G. S. Murugan, N. P. Sessions, S. J. Pearce, V. Apostolopoulos, and J. S. Wilkinson
  • Published on: 07/03/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1515–1525 (2014)
  • Roman Kostecki, Heike Ebendorff-Heidepriem, Shahraam Afshar V., Grant McAdam, Claire Davis, and Tanya M. Monro
  • Published on: 07/03/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1526–1534 (2014)
  • Tun Cao, Chenwei Wei, and Lei Zhang
  • Published on: 07/03/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1535–1544 (2014)
  • Li Wu, Minyuan Ji, Hongrun Wang, Yongfa Kong, and Yi Zhang
  • Published on: 07/03/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1494–1504 (2014)
  • Heike Ebendorff-Heidepriem, Juliane Schuppich, Alastair Dowler, Luis Lima-Marques, and Tanya M. Monro
  • Published on: 07/02/14

  • Optical Materials Express, Vol. 4, Iss. 8, pp. 1487–1493 (2014)
  • D. Pierangeli, F. Di Mei, J. Parravicini, GB. Parravicini, A. J. Agranat, C. Conti, and E. DelRe
  • Published on: 07/01/14
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