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Two-wavelength interferometry: extended range and accurate optical path difference analytical estimatorPublished in JOSA A, Vol. 26 Issue 12, pp.2503-2511 (2009) |
Spotlight summary: Two wavelength interferometry has been used to improve the resolution and decrease ambiguities in determining surfaces from an interferometer. The current work develops an optimized form of two-wavelength interferometry, which expands the total surface over which unambiguous reconstruction can be achieved.
Technical Division: Optical Design and Instrumentation
ToC Category: Instrumentation, Measurement, and Metrology
| OCIS Codes: | (110.5100) Imaging systems : Phased-array imaging systems |
| (120.2650) Instrumentation, measurement, and metrology : Fringe analysis | |
| (120.3180) Instrumentation, measurement, and metrology : Interferometry | |
| (120.3940) Instrumentation, measurement, and metrology : Metrology |
Posted on November 25, 2009
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