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  • November 2009

Optics InfoBase > Spotlight on Optics > Two-wavelength interferometry: extended range and accurate optical path difference analytical estimator


Two-wavelength interferometry: extended range and accurate optical path difference analytical estimator

Published in JOSA A, Vol. 26 Issue 12, pp.2503-2511 (2009)
by Kamel Houairi and Frédéric Cassaing

Source article Abstract | Full Text: XHTML | Full Text: PDF


Spotlight summary: Two wavelength interferometry has been used to improve the resolution and decrease ambiguities in determining surfaces from an interferometer. The current work develops an optimized form of two-wavelength interferometry, which expands the total surface over which unambiguous reconstruction can be achieved.

Technical Division: Optical Design and Instrumentation
ToC Category: Instrumentation, Measurement, and Metrology
OCIS Codes: (110.5100) Imaging systems : Phased-array imaging systems
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology


Posted on November 25, 2009

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