Two-wavelength interferometry: extended range and accurate optical path difference analytical estimator
Spotlight summary: Two wavelength interferometry has been used to improve the resolution and decrease ambiguities in determining surfaces from an interferometer. The current work develops an optimized form of two-wavelength interferometry, which expands the total surface over which unambiguous reconstruction can be achieved.
Technical Division: Optical Design and Instrumentation
ToC Category: Instrumentation, Measurement, and Metrology
|OCIS Codes:||(110.5100) Imaging systems : Phased-array imaging systems|
|(120.2650) Instrumentation, measurement, and metrology : Fringe analysis|
|(120.3180) Instrumentation, measurement, and metrology : Interferometry|
|(120.3940) Instrumentation, measurement, and metrology : Metrology|
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