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Optics InfoBase > Table of Contents Categories > Instrumentation, measurement, and metrology
OSA articles that appear in current and forthcoming issues.
Determination of photo-induced changes in linear optical coefficients by the Z-scan technique
Improved model-based infrared reflectrometry for measuring deep trench structures
A generalized reference-plane-based calibration method in optical triangular profilometry
Demonstration of an optical frequency synthesizer with zero carrier-envelope-offset frequency stabilized by the direct locking method
High resolution interferometer with multiple-pass optical configuration
Two-wavelength interferometry: extended range and accurate optical path difference analytical estimator
Stokes polarimeter optimization in the presence of shot and gaussian noise
Device based in-chip critical dimension and overlay metrology
Rapid Mueller matrix polarimetry based on parallelized polarization state generation and detection
Adaptive correction method of inhomogeneous light intensity for digital speckle interferometry by subtraction
Subdivision and direction recognition of λ/16 of orthogonal fringes for nanometric measurement
Two-color-absorption sensor for time-resolved measurements of gasoline concentration and temperature
The general theory of phase shifting algorithms
Ultrabroadband optical chirp linearization for precision metrology applications
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Select a Journal: J. Opt. Soc. Am. AJ. Opt. Soc. Am. BApplied OpticsOptics LettersOptics ExpressAdv. Opt. Photon.J. Opt. Netw. (2002-2009)J. Opt. Soc. Am. (1917-1983)Virtual J. Biomed. Opt.Optics NewsJ. Opt. Commun. Netw.J. Lightwave Technol.J. Opt. Technol.J. Display Technol.Chinese Optics LettersApplied Spectroscopy Year