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Table of Contents Category - Microscopy

OSA articles that appear in current and forthcoming issues.

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  • JOSA B, Vol. 26 Issue 11, pp.2101-2108 (2009)
  • Blum, Christian; Mosk, Allard P; Otto, Cees; Vos, Willem L; Subramaniam, Vinod
  • We present the application of spectral emission imaging microscopy as a method to quantitatively map photonic properties from below the surface of strongly interacting photonic...

  • Optics Letters, Vol. 34 Issue 22, pp.3508-3510 (2009)
  • Gong, Wei; Si, Ke; Chen, Nanguang; Sheppard, Colin J R
  • We show that the focal modulation microscopy (FMM), which combines a spatial phase modulator with confocal microscopy, results in an improvement in spatial resolution. This technique...

  • Optics Letters, Vol. 34 Issue 22, pp.3583-3585 (2009)
  • Vicidomini, Giuseppe; Hell, Stefan W; Schönle, Andreas
  • We propose a maximum a posteriori-based method that solves an important practical problem in the deconvolution of 4Pi images by simultaneously delivering an estimate of both the...

  • Optics Express, Vol. 17 Issue 23, pp.20700-20706 (2009)
  • Pegoraro, Adrian F; Ridsdale, Andrew; Moffatt, Douglas J; Pezacki, John P; Thomas, Brian K; Fu, Libin; Dong, Liang; Fermann, Martin E; Stolow, Albert
  • Using an all-fiber laser system consisting of a femtosecond Er/Yb fiber oscillator as the pump and an ultra-highly nonlinear fiber for Stokes generation, we demonstrate multimodal...

  • JOSA A, Vol. 26 Issue 12, pp.2550-2557 (2009)
  • Sentenac, Anne; Belkebir, Kamal; Giovannini, Hugues; Chaumet, Patrick C
  • We compare the performance of a total-internal-reflection fluorescence microscope under varying illumination and substrate conditions. The samples are deposited on a standard...

  • Optics Letters, Vol. 34 Issue 23, pp.3668-3670 (2009)
  • Park, YongKeun; Yamauchi, Toyohiko; Choi, Wonshik; Dasari, Ramachandra; Feld, Michael S
  • We report a practical method for label-free quantification of specific molecules using spectroscopic imaging of sample-induced phase shifts. Diffraction phase microscopy equipped...
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