Abstract

To increase the signal-to-noise ratio and to remove the spatially slow varying signals, a lock-in amplifier is often used in scanning probe microscopy. The signal reconstructed from the lock-in data contains the contributions of the evanescent and homogeneous waves that are mixed in the near-field zone (i.e., at a very short distance). The resolution is determined and a method is given to suppress the useless background information. Experimental images of nanoparticles are processed.

© 2007 Optical Society of America

Scanning near-field optical data contrast measurement: a tomographylike near-field reconstruction

Dominique Barchiesi
Appl. Opt. 45(29) 7597-7601 (2006)

Signal reconstruction from a scanning near-field optical microscopy approach curve

Dominique Barchiesi and Thomas Grosges
Opt. Express 13(17) 6519-6526 (2005)

Analytical analysis of modulated signal in apertureless scanning near-field optical microscopy

C. H. Chuang and Y. L. Lo
Opt. Express 15(24) 15782-15796 (2007)

Analysis of the interferometric effect of the background light in apertureless scanning near-field optical microscopy

Sébastien Aubert, Aurélien Bruyant, Sylvain Blaize, Renaud Bachelot, Gilles Lerondel, Sylvain Hudlet, and Pascal Royer
J. Opt. Soc. Am. B 20(10) 2117-2124 (2003)

Apertureless scanning near-field optical microscopy: a comparison between homodyne and heterodyne approaches

Lewis Gomez, Renaud Bachelot, Alexandre Bouhelier, Gary P. Wiederrecht, Shih-hui Chang, Stephen K. Gray, Feng Hua, Seokwoo Jeon, John A. Rogers, Miguel E. Castro, Sylvain Blaize, Ilan Stefanon, Gilles Lerondel, and Pascal Royer
J. Opt. Soc. Am. B 23(5) 823-833 (2006)