Polarization Properties of Oblique Incidence Scanning Tunneling Microscopy–Tip-Enhanced Raman Spectroscopy
Applied Spectroscopy, Vol. 61, Issue 12, pp. 1301-1305 (2007)
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Abstract
We used scanning tunneling microscopy–tip-enhanced Raman spectroscopy (STM-TERS) to study the polarization properties of near-field scattering on a crystalline material as well as on a dye adsorbate. The measurements on a (111)-oriented c-Si sample were found to be well described by a recently proposed model for TERS and allowed for a characterization of the polarization properties of the tips used. The tip enhancement was stronger for excitation radiation having a field component along the tip axis for both types of samples. A non-negligible enhancement was also found for the field component perpendicular to the tip axis.
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Citation
Gennaro Picardi, Quang Nguyen, Razvigor Ossikovski, and Joachim Schreiber, "Polarization Properties of Oblique Incidence Scanning Tunneling Microscopy–Tip-Enhanced Raman Spectroscopy," Appl. Spectrosc. 61, 1301-1305 (2007)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=as-61-12-1301
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