Chromatically dispersed interferometry with wavelet analysis
Optics Letters, Vol. 31, Issue 5, pp. 589-591 (2006)
http://dx.doi.org/10.1364/OL.31.000589
Enhanced HTML 
Acrobat PDF (120 KB)
Abstract
A new white-light interferometry point sensor utilizing a chromatically dispersed depth detection field is addressed. Monitoring the interference in the optical frequency domain allows for microscopic height detection without the necessity of a mechanical axial scan. The problem of limited dynamic range in previously reported spectral interferometric schemes is solved by forming a high-contrast interference window due to the chromatically dispersed focusing of the detection field. In a proof-of-principle experiment, the position of a reflecting object could be retrieved with a focus of 0.8 NA over an axial range of
© 2006 Optical Society of America
OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(180.3170) Microscopy : Interference microscopy
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: October 24, 2005
Manuscript Accepted: November 18, 2005
Virtual Issues
Vol. 1, Iss. 4 Virtual Journal for Biomedical Optics
Citation
Evangelos Papastathopoulos, Klaus Körner, and Wolfgang Osten, "Chromatically dispersed interferometry with wavelet analysis," Opt. Lett. 31, 589-591 (2006)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ol-31-5-589
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Offset of Coherent Envelope Position Due to Phase Change on Reflection (AO)
- Diffraction-induced coherence levels (AO)
- Chromatic confocal spectral interferometry (AO)
- Stabilizing method for reflection interference contrast microscopy (AO)
- Fiber-coupled displacement interferometry without periodic nonlinearity (OL)
Related Conference Papers
- Illumination and Effective Collection Volumes for Fiber Optic Probes in Tissue
- Electro-Optical Microscopy: New Technique to Map Electric Fields in Polymers and Membranes with Micrometer Resolution
- Bioaerosol Enricher and Identifier System: From Fluorescence Spectrum to Biochemical Assay
- Development of a Novel Femtosecond Micromachining Workstation Using Spectral Interferometry
- Gravitational Waves: From Astrophysics to Optics
« Previous Article | Next Article »
OSA is a member of 