Random depth access full-field heterodyne low-coherence interferometry utilizing acousto-optic modulation and a complementary metal-oxide semiconductor camera
Optics Letters, Vol. 31, Issue 7, pp. 912-914 (2006)
http://dx.doi.org/10.1364/OL.31.000912
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Abstract
With analog scanning, time-domain low-coherence interferometry lacks precise depth information, and optical carrier generation demands a linear scanning speed. Full-field heterodyne low-coherence interferometry that uses a logarithmic complementary metal-oxide semiconductor camera, acousto-optic modulation, and digital depth stepping is reported, with which random regions of interest, lateral and axial, can be accessed. Furthermore, nanometer profilometry is possible through heterodyne phase retrieval of the interference signal. The approach demonstrates inexpensive yet high-precision functional machine vision offering true digital random access in three dimensions.
© 2006 Optical Society of America
OCIS Codes
(040.2840) Detectors : Heterodyne
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(150.6910) Machine vision : Three-dimensional sensing
(230.1040) Optical devices : Acousto-optical devices
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: November 8, 2005
Revised Manuscript: December 31, 2005
Manuscript Accepted: January 3, 2006
Virtual Issues
Vol. 1, Iss. 5 Virtual Journal for Biomedical Optics
Citation
Patrick Egan, Michael J. Connelly, Fereydoun Lakestani, and Maurice P. Whelan, "Random depth access full-field heterodyne low-coherence interferometry utilizing acousto-optic modulation and a complementary metal-oxide semiconductor camera," Opt. Lett. 31, 912-914 (2006)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ol-31-7-912
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