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Virtual Journal for Biomedical Optics

Virtual Journal for Biomedical Optics

| EXPLORING THE INTERFACE OF LIGHT AND BIOMEDICINE

  • Editor: Gregory W. Faris
  • Vol. 5, Iss. 10 — Jul. 19, 2010

Extended depth-of-focus by digital holographic microscopy

Tristan Colomb, Nicolas Pavillon, Jonas Kühn, Etienne Cuche, Christian Depeursinge, and Yves Emery  »View Author Affiliations


Optics Letters, Vol. 35, Issue 11, pp. 1840-1842 (2010)
http://dx.doi.org/10.1364/OL.35.001840


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Abstract

A recurrent problem in microscopy is the finite depth-of-focus linked to the NA of microscope objectives. Digital holographic microscopy (DHM) has the unique feature of being able to numerically change the focus from a single hologram without the need of moving the sample. Extended depth of focus of amplitude images has been demonstrated, but it has marginal interest for the metrological application of DHM that needs the topography. In this Letter, we demonstrate that DHM is able to provide not only extended depth-of-focus amplitude images but extended focused complex data from which the topography is computed. For this purpose, reflection and transmission measurements on micro-optics (microlens and retroreflector) performed by using standard reconstruction or the extended focused complex data are compared. These experiments demonstrate that DHM measures, from a single hologram acquisition, the accurate sample topography on a numerically increased depth-of-focus.

© 2010 Optical Society of America

OCIS Codes
(100.2980) Image processing : Image enhancement
(180.3170) Microscopy : Interference microscopy
(090.1995) Holography : Digital holography

ToC Category:
Holography

History
Original Manuscript: March 12, 2010
Manuscript Accepted: April 16, 2010
Published: May 24, 2010

Virtual Issues
Vol. 5, Iss. 10 Virtual Journal for Biomedical Optics

Citation
Tristan Colomb, Nicolas Pavillon, Jonas Kühn, Etienne Cuche, Christian Depeursinge, and Yves Emery, "Extended depth-of-focus by digital holographic microscopy," Opt. Lett. 35, 1840-1842 (2010)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ol-35-11-1840

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