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Virtual Journal for Biomedical Optics


  • Editors: Andrew Dunn and Anthony Durkin
  • Vol. 6, Iss. 9 — Oct. 3, 2011

Tight focusing with a binary microaxicon

V. V. Kotlyar, S. S. Stafeev, L. O’Faolain, and V. A. Soifer  »View Author Affiliations

Optics Letters, Vol. 36, Issue 16, pp. 3100-3102 (2011)

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Using a near-field scanning microscope (NT-MDT) with a 100 nm aperture cantilever held 1 μm apart from a microaxicon of diameter 14 μm and period 800 nm , we measure a focal spot resulting from the illumination by a linearly polarized laser light of wavelength λ = 532 nm , with its FWHM being equal to 0.58 λ , and the depth of focus being 5.6 λ . The rms deviation of the focal spot intensity from the calculated value is 6%. The focus intensity is five times larger than the maximal illumination beam intensity.

© 2011 Optical Society of America

OCIS Codes
(050.1380) Diffraction and gratings : Binary optics
(180.4243) Microscopy : Near-field microscopy

ToC Category:
Diffraction and Gratings

Original Manuscript: April 26, 2011
Revised Manuscript: July 7, 2011
Manuscript Accepted: July 7, 2011
Published: August 8, 2011

Virtual Issues
Vol. 6, Iss. 9 Virtual Journal for Biomedical Optics

V. V. Kotlyar, S. S. Stafeev, L. O’Faolain, and V. A. Soifer, "Tight focusing with a binary microaxicon," Opt. Lett. 36, 3100-3102 (2011)

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