Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Characterization of high refractive index semiconductor films by surface plasmon resonance

Not Accessible

Your library or personal account may give you access

Abstract

Si-based surface plasmon resonance (SPR) in the Kretschmann–Raether geometry is considered as a platform for the optical measurement of high refractive index films. The implementation of the SPR effect becomes possible due to the relatively high index of refraction of Si compared to most materials. As examples we study the SPR responses for some important semiconductor-based films, including laser-ablated porous silicon and thin germanium films. Using SPR data, we determine the refractive indices of these films for different parameters (thickness and porosity) and ambiences. We also discuss novel SPR biosensor architectures with the use of these solid films.

© 2006 Optical Society of America

Full Article  |  PDF Article
More Like This
Surface plasmon resonance-based highly sensitive optical touch sensor with a hybrid noise rejection scheme

Sarun Sumriddetchkajorn and Kosom Chaitavon
Appl. Opt. 45(1) 172-177 (2006)

Silicon-based surface plasmon resonance sensing with two surface plasmon polariton modes

Sergiy Patskovsky, Andrei V. Kabashin, Michel Meunier, and John H. T. Luong
Appl. Opt. 42(34) 6905-6909 (2003)

Metallic film optimization in a surface plasmon resonance biosensor by the extended Rouard method

P. Lecaruyer, M. Canva, and J. Rolland
Appl. Opt. 46(12) 2361-2369 (2007)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (5)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (2)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved