Scanning transmission microscopy using a position-sensitive detector
Applied Optics, Vol. 45, Issue 33, pp. 8410-8418 (2006)
http://dx.doi.org/10.1364/AO.45.008410
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Abstract
Optical data manipulation technologies increasingly employ densely aperiodic optical 3D phase elements. Refinement of such technologies will require the capability to quantitatively characterize the volumetric dielectric modulation of an optical sample to a high level of precision and spatial resolution. We present a scanning transmission microscopy system that uses a position-sensitive detector to impart sensitivity to both the phase and absorption components. We describe the layout of the instrument and then derive its phase and absorption transfer functions. Simulations and experiments are presented to validate the analysis. For phase detection, the instrument possesses depth-sectioning properties similar to those of a confocal microscope without the use of a pinhole, enabling full 3D object reconstruction.
© 2006 Optical Society of America
OCIS Codes
(110.4850) Imaging systems : Optical transfer functions
(180.5810) Microscopy : Scanning microscopy
(180.6900) Microscopy : Three-dimensional microscopy
History
Original Manuscript: April 10, 2006
Manuscript Accepted: May 25, 2006
Virtual Issues
Vol. 1, Iss. 12 Virtual Journal for Biomedical Optics
Citation
Mark R. Ayres and Robert R. McLeod, "Scanning transmission microscopy using a position-sensitive detector," Appl. Opt. 45, 8410-8418 (2006)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ao-45-33-8410
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