Generalization of the Rouard method to an absorbing thin-film stack and application to surface plasmon resonance
Applied Optics, Vol. 45, Issue 33, pp. 8419-8423 (2006)
http://dx.doi.org/10.1364/AO.45.008419
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Abstract
In the context of surface plasmon resonance (SPR) kinetic biochips, it is important to model the SPR phenomenon (i.e., extinction of reflectivity) toward biochip design and optimization. The Rouard approach that models reflectivity off a thin-film stack is shown to be extendable to any number of absorbing layers with no added complexity. Using the generalized Rouard method, the effect of SPR is simulated as a function of the wavelength for various metal thicknesses. Given an optimal metal thickness, the dependence of SPR on the angle of incidence and wavelength is also demonstrated. Such a model constitutes a potential basis for the efficient design and optimization of multidimensional sensors.
© 2006 Optical Society of America
OCIS Codes
(080.2720) Geometric optics : Mathematical methods (general)
(190.4350) Nonlinear optics : Nonlinear optics at surfaces
(310.6860) Thin films : Thin films, optical properties
History
Original Manuscript: March 16, 2006
Revised Manuscript: August 30, 2006
Manuscript Accepted: September 1, 2006
Virtual Issues
Vol. 1, Iss. 12 Virtual Journal for Biomedical Optics
Citation
Pierre Lecaruyer, Emmanuel Maillart, Michael Canva, and Jannick Rolland, "Generalization of the Rouard method to an absorbing thin-film stack and application to surface plasmon resonance," Appl. Opt. 45, 8419-8423 (2006)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ao-45-33-8419
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