Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide
Applied Optics, Vol. 46, Issue 15, pp. 2949-2953 (2007)
http://dx.doi.org/10.1364/AO.46.002949
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Abstract
We introduce a very sensitive new configuration, to the best of our knowledge, in an optical microscope system that utilizes two detectors: one is to measure the power of a low reflected signal from a sample, and the other is only to monitor the confocal geometry of the system. With this new configuration, we could effectively remove measurement noise associated with small perturbation in measurement conditions such as surface curvature, tilt, and vibration in a microscope system. We have obtained a high-resolution relative index precision of
© 2007 Optical Society of America
OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(060.2300) Fiber optics and optical communications : Fiber measurements
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
ToC Category:
Fiber Optics and Optical Communications
History
Original Manuscript: October 18, 2006
Manuscript Accepted: January 4, 2007
Published: May 1, 2007
Virtual Issues
Vol. 2, Iss. 6 Virtual Journal for Biomedical Optics
Citation
Youngchun Youk and Dug Young Kim, "Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide," Appl. Opt. 46, 2949-2953 (2007)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ao-46-15-2949
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