Three-dimensional particle tracking with subnanometer resolution using off-focus images
Applied Optics, Vol. 47, Issue 13, pp. 2361-2370 (2008)
http://dx.doi.org/10.1364/AO.47.002361
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Abstract
A three-dimensional (3D) particle tracking algorithm based on microscope off-focus images is presented in this paper. Subnanometer resolution in all three axes at
© 2008 Optical Society of America
OCIS Codes
(100.2000) Image processing : Digital image processing
(150.6910) Machine vision : Three-dimensional sensing
(350.5730) Other areas of optics : Resolution
ToC Category:
Image Processing
History
Original Manuscript: January 3, 2008
Revised Manuscript: March 14, 2008
Manuscript Accepted: March 14, 2008
Published: April 28, 2008
Virtual Issues
Vol. 3, Iss. 6 Virtual Journal for Biomedical Optics
Citation
Zhipeng Zhang and Chia-Hsiang Menq, "Three-dimensional particle tracking with subnanometer resolution using off-focus images," Appl. Opt. 47, 2361-2370 (2008)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ao-47-13-2361
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