Noise reduction in digital speckle pattern interferometry using bidimensional empirical mode decomposition
Applied Optics, Vol. 47, Issue 14, pp. 2592-2598 (2008)
http://dx.doi.org/10.1364/AO.47.002592
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Abstract
We propose a bidimensional empirical mode decomposition (BEMD) method to reduce speckle noise in digital speckle pattern interferometry (DSPI) fringes. The BEMD method is based on a sifting process that decomposes the DSPI fringes in a finite set of subimages represented by high and low frequency oscillations, which are named modes. The sifting process assigns the high frequency information to the first modes, so that it is possible to discriminate speckle noise from fringe information, which is contained in the remaining modes. The proposed method is a fully data-driven technique, therefore neither fixed basis functions nor operator intervention are required. The performance of the BEMD method to denoise DSPI fringes is analyzed using computer-simulated data, and the results are also compared with those obtained by means of a previously developed one-dimensional empirical mode decomposition approach. An application of the proposed BEMD method to denoise experimental fringes is also presented.
© 2008 Optical Society of America
OCIS Codes
(100.2000) Image processing : Digital image processing
(100.2650) Image processing : Fringe analysis
(100.2980) Image processing : Image enhancement
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: December 18, 2007
Revised Manuscript: April 3, 2008
Manuscript Accepted: April 10, 2008
Published: May 2, 2008
Virtual Issues
Vol. 3, Iss. 6 Virtual Journal for Biomedical Optics
Citation
María Belén Bernini, Alejandro Federico, and Guillermo H. Kaufmann, "Noise reduction in digital speckle pattern interferometry using bidimensional empirical mode decomposition," Appl. Opt. 47, 2592-2598 (2008)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ao-47-14-2592
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