Generalized model for incoherent detection in confocal optical microscopy
Applied Optics, Vol. 49, Issue 16, pp. D96-D105 (2010)
http://dx.doi.org/10.1364/AO.49.000D96
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Abstract
We develop a generalized model in order to calculate the point spread functions in both the focal and the detection planes for the electric field strengths. In these calculations, based on the generalized Jones matrices, we introduce all of the interdependent parameters that could influence the spatial resolution of a confocal optical microscope. Our proposed model is more nearly complete, since we make no ap proximations of the scattered electric fields. These results can be successfully applied to standard confocal optical techniques to get a better understanding for more quantitative interpretations of the probe.
© 2010 Optical Society of America
OCIS Codes
(120.1880) Instrumentation, measurement, and metrology : Detection
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(180.1790) Microscopy : Confocal microscopy
(350.5730) Other areas of optics : Resolution
ToC Category:
Microscopy
History
Original Manuscript: December 9, 2009
Revised Manuscript: February 21, 2010
Manuscript Accepted: March 3, 2010
Published: March 23, 2010
Virtual Issues
Vol. 5, Iss. 10 Virtual Journal for Biomedical Optics
Citation
Rachid Hammoum, Sidi Ould Saad Hamady, and Marc D. Fontana, "Generalized model for incoherent detection in confocal optical microscopy," Appl. Opt. 49, D96-D105 (2010)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ao-49-16-D96
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