White-light total internal reflection microscopy for characterizing the optical properties of Ag-coated optical fiber tips
Applied Optics, Vol. 49, Issue 20, pp. 3905-3908 (2010)
http://dx.doi.org/10.1364/AO.49.003905
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Abstract
The optical properties of the metallized tips used in tip-enhanced Raman spectroscopy (TERS) are vital to resonance enhancement. A white-light scattering-spectrum measuring setup based on total internal reflection microscopy is developed to characterize the optical responses of the metallized tips. The scattering spectra of the Ag-coated optical fiber tips are measured as a demonstration of the methodology and the performance of the setup. A prominent resonance band of
© 2010 Optical Society of America
OCIS Codes
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(260.6970) Physical optics : Total internal reflection
(180.4243) Microscopy : Near-field microscopy
ToC Category:
Microscopy
History
Original Manuscript: March 30, 2010
Revised Manuscript: June 13, 2010
Manuscript Accepted: June 17, 2010
Published: July 6, 2010
Virtual Issues
Vol. 5, Iss. 11 Virtual Journal for Biomedical Optics
Citation
Rui Wang, Jia Wang, Fenghuan Hao, and Qian Tian, "White-light total internal reflection microscopy for characterizing the optical properties of Ag-coated optical fiber tips," Appl. Opt. 49, 3905-3908 (2010)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ao-49-20-3905
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