Coherent incident field information through thick random scattering media from speckle correlations over source position
Applied Optics, Vol. 49, Issue 30, pp. 5899-5905 (2010)
http://dx.doi.org/10.1364/AO.49.005899
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Abstract
With two nonoverlapping beams incident at different angles on a heavily scattering medium, the spatial correlation of speckle patterns over source position has a beat that is related to the incident angle difference. A model presented explains the measurement. The spatial correlation is shown to decorrelate faster than the beam intensity correlation function and to be sensitive to the incident field profile. Increased scatter results in more rapid decorrelation. This work suggests new opportunities for imaging through scattering media.
© 2010 Optical Society of America
OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(030.6600) Coherence and statistical optics : Statistical optics
(110.6150) Imaging systems : Speckle imaging
(290.7050) Scattering : Turbid media
ToC Category:
Coherence and Statistical Optics
History
Original Manuscript: March 2, 2010
Manuscript Accepted: August 20, 2010
Published: October 18, 2010
Virtual Issues
Vol. 6, Iss. 1 Virtual Journal for Biomedical Optics
Citation
Zhenyu Wang, Kevin J. Webb, and Andrew M. Weiner, "Coherent incident field information through thick random scattering media from speckle correlations over source position," Appl. Opt. 49, 5899-5905 (2010)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ao-49-30-5899
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