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Slightly off-axis interferometry for microscopy with second wavelength assistance |
Applied Optics, Vol. 50, Issue 17, pp. 2793-2798 (2011)
http://dx.doi.org/10.1364/AO.50.002793
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Abstract
Slightly off-axis interferometry for microscopy has been performed, where the
© 2011 Optical Society of America
OCIS Codes
(090.2880) Holography : Holographic interferometry
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.3170) Microscopy : Interference microscopy
ToC Category:
Microscopy
History
Original Manuscript: January 12, 2011
Revised Manuscript: April 8, 2011
Manuscript Accepted: April 14, 2011
Published: June 9, 2011
Virtual Issues
Vol. 6, Iss. 7 Virtual Journal for Biomedical Optics
Citation
Junhe Han, Peng Gao, Baoli Yao, Yuzong Gu, and Mingju Huang, "Slightly off-axis interferometry for microscopy with second wavelength assistance," Appl. Opt. 50, 2793-2798 (2011)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ao-50-17-2793
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