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Virtual Journal for Biomedical Optics

Virtual Journal for Biomedical Optics

| EXPLORING THE INTERFACE OF LIGHT AND BIOMEDICINE

  • Editors: Andrew Dunn and Anthony Durkin
  • Vol. 6, Iss. 8 — Aug. 26, 2011

Polar decomposition of the Mueller matrix: a polarimetric rule of thumb for square-profile surface structure recognition

J. M. Sanz, J. M. Saiz, F. González, and F. Moreno  »View Author Affiliations


Applied Optics, Vol. 50, Issue 21, pp. 3781-3788 (2011)
http://dx.doi.org/10.1364/AO.50.003781


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Abstract

In this research, the polar decomposition (PD) method is applied to experimental Mueller matrices (MMs) measured on two-dimensional microstructured surfaces. Polarization information is expressed through a set of parameters of easier physical interpretation. It is shown that evaluating the first derivative of the retardation parameter, δ, a clear indication of the presence of defects either built on or dug in the scattering flat surface (a silicon wafer in our case) can be obtained. Although the rule of thumb thus obtained is established through PD, it can be easily implemented on conventional surface polarimetry. These results constitute an example of the capabilities of the PD approach to MM analysis, and show a direct application in surface characterization.

© 2011 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.0290) Scattering : Scattering

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: February 15, 2011
Revised Manuscript: May 3, 2011
Manuscript Accepted: May 24, 2011
Published: July 11, 2011

Virtual Issues
Vol. 6, Iss. 8 Virtual Journal for Biomedical Optics

Citation
J. M. Sanz, J. M. Saiz, F. González, and F. Moreno, "Polar decomposition of the Mueller matrix: a polarimetric rule of thumb for square-profile surface structure recognition," Appl. Opt. 50, 3781-3788 (2011)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ao-50-21-3781

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