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Back-focal-plane position detection with extended linear range for photonic force microscopy |
Applied Optics, Vol. 51, Issue 25, pp. 5973-5977 (2012)
http://dx.doi.org/10.1364/AO.51.005973
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Abstract
In photonic force microscopes, the position detection with high temporal and spatial resolution is usually implemented by a quadrant position detector placed in the back focal plane of a condenser. An objective with high numerical aperture (NA) for the optical trap has also been used to focus a detection beam. In that case the displacement of the probe at a fixed position of the detector produces a unique and linear response only in a restricted region of the probe displacement, usually several hundred nanometers. There are specific experiments where the absolute position of the probe is a relevant measure together with the probe position relative the optical trap focus. In our scheme we introduce the detection beam into the condenser with low NA through a pinhole with tunable size. This combination permits us to create a wide detection spot and to achieve the linear range of several micrometers by the probe position detection without reducing the trapping force.
© 2012 Optical Society of America
OCIS Codes
(290.5820) Scattering : Scattering measurements
(350.4855) Other areas of optics : Optical tweezers or optical manipulation
ToC Category:
Scattering
History
Original Manuscript: March 26, 2012
Revised Manuscript: June 14, 2012
Manuscript Accepted: July 17, 2012
Published: August 22, 2012
Virtual Issues
Vol. 7, Iss. 11 Virtual Journal for Biomedical Optics
Citation
Ignacio A. Martínez and Dmitri Petrov, "Back-focal-plane position detection with extended linear range for photonic force microscopy," Appl. Opt. 51, 5973-5977 (2012)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ao-51-25-5973
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