Abstract
LiF crystal and film detectors were used to measure the far-field fluence profile of a self-amplified spontaneous-emission free-electron laser beam and diffraction imaging with high spatial resolution. In these measurements the photoluminescence (PL) response of LiF crystal and film was compared over a wide range of soft x-ray fluences. It was found that the soft x-ray fluence dependences of LiF crystal and film differ. At low fluence, the LiF crystal shows higher PL response compared to LiF film, while this comparison is the opposite at higher fluence. Accurate measurement of LiF crystal and film PL response is important for precise characterization of the spatial, spectral, and coherence features of x-ray beams across the full profile and in localized areas. For such measurements, crucial LiF detector attributes are high spatial resolution and high dynamic range.
© 2013 Optical Society of America
Full Article | PDF ArticleMore Like This
Tatiana Pikuz, Anatoly Faenov, Yuji Fukuda, Masaki Kando, Paul Bolton, Alexander Mitrofanov, Alexander Vinogradov, Mitsuru Nagasono, Haruhiko Ohashi, Makina Yabashi, Kensuke Tono, Yashinori Senba, Tadashi Togashi, and Tetsuya Ishikawa
Opt. Express 20(4) 3424-3433 (2012)
Tatiana A. Pikuz, Anatoly Ya. Faenov, Sergei V. Gasilov, Igor Yu. Skobelev, Yuji Fukuda, Masaki Kando, Hideyuki Kotaki, Takayuki Homma, Keigo Kawase, Yukio Hayashi, Tetsuya Kawachi, Hiroyuki Daido, Yoshiaki Kato, and Sergei V. Bulanov
Appl. Opt. 48(32) 6271-6276 (2009)
Masahiko Ishino, Thanh-Hung Dinh, Yuji Hosaka, Noboru Hasegawa, Kimio Yoshimura, Hiroki Yamamoto, Tadashi Hatano, Takeshi Higashiguchi, Kazuyuki Sakaue, Satoshi Ichimaru, Masatoshi Hatayama, Akira Sasaki, Masakazu Washio, Masaharu Nishikino, and Yasunari Maekawa
Appl. Opt. 59(12) 3692-3698 (2020)