Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 65,
  • Issue 6,
  • pp. 611-619
  • (2011)

Semi-Automated Detection of Trace Explosives in Fingerprints on Strongly Interfering Surfaces with Raman Chemical Imaging

Not Accessible

Your library or personal account may give you access

Abstract

We have previously demonstrated the use of wide-field Raman chemical imaging (RCI) to detect and identify the presence of trace explosives in contaminated fingerprints. In this current work we demonstrate the detection of trace explosives in contaminated fingerprints on strongly Raman scattering surfaces such as plastics and painted metals using an automated background subtraction routine. We demonstrate the use of partial least squares subtraction to minimize the interfering surface spectral signatures, allowing the detection and identification of explosive materials in the corrected Raman images. The resulting analyses are then visually superimposed on the corresponding bright field images to physically locate traces of explosives. Additionally, we attempt to address the question of whether a complete RCI of a fingerprint is required for trace explosive detection or whether a simple non-imaging Raman spectrum is sufficient. This investigation further demonstrates the ability to nondestructively identify explosives on fingerprints present on commonly found surfaces such that the fingerprint remains intact for further biometric analysis.

PDF Article
More Like This
Infrared photothermal imaging spectroscopy for detection of trace explosives on surfaces

Christopher A. Kendziora, Robert Furstenberg, Michael Papantonakis, Viet Nguyen, Jeff Byers, and R. Andrew McGill
Appl. Opt. 54(31) F129-F138 (2015)

Stand-off detection of explosives particles by multispectral imaging Raman spectroscopy

Henric Östmark, Markus Nordberg, and Torgny E. Carlsson
Appl. Opt. 50(28) 5592-5599 (2011)

Detection of explosives based on surface-enhanced Raman spectroscopy

Hainer Wackerbarth, Christian Salb, Lars Gundrum, Matthias Niederkrüger, Konstantin Christou, Volker Beushausen, and Wolfgang Viöl
Appl. Opt. 49(23) 4362-4366 (2010)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved