OSA's Digital Library

Virtual Journal for Biomedical Optics

Virtual Journal for Biomedical Optics

| EXPLORING THE INTERFACE OF LIGHT AND BIOMEDICINE

  • Editor: Gregory W. Faris
  • Vol. 1, Iss. 6 — Jun. 13, 2006

Analysis of mode coupling due to spherical defects in ideal fully metal-coated scanning near-field optical microscopy probes

Wataru Nakagawa, Luciana Vaccaro, and Hans Peter Herzig  »View Author Affiliations


JOSA A, Vol. 23, Issue 5, pp. 1096-1105 (2006)
http://dx.doi.org/10.1364/JOSAA.23.001096


View Full Text Article

Enhanced HTML    Acrobat PDF (765 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We investigate the effect of defects in the metal-coating layer of a scanning near-field optical microscopy (SNOM) probe on the coupling of polarization modes using rigorous electromagnetic modeling tools. Because of practical limitations, we study an ensemble of simple defects to identify important trends and then extrapolate these results to more realistic structures. We find that a probe with many random defects will produce a small but significant coupling of energy between a linearly polarized input mode and a radial/longitudinal polarization mode, which is known to produce a strongly localized emitted optical field and is desirable for SNOM applications.

© 2006 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(260.5430) Physical optics : Polarization
(350.5500) Other areas of optics : Propagation

ToC Category:
Microscopy

History
Original Manuscript: July 19, 2005
Revised Manuscript: October 12, 2005
Manuscript Accepted: November 2, 2005

Virtual Issues
Vol. 1, Iss. 6 Virtual Journal for Biomedical Optics

Citation
Wataru Nakagawa, Luciana Vaccaro, and Hans Peter Herzig, "Analysis of mode coupling due to spherical defects in ideal fully metal-coated scanning near-field optical microscopy probes," J. Opt. Soc. Am. A 23, 1096-1105 (2006)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=josaa-23-5-1096


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. R. Bachelot, P. Gleyzes, and A. C. Boccara, "Reflection-mode scanning near-field optical microscopy using an apertureless metallic tip," Appl. Opt. 36, 2160-2170 (1997). [CrossRef] [PubMed]
  2. G. Schürmann, W. Noell, U. Staufer, and N. F. de Rooij, "Microfabrication of a combined AFM-SNOM sensor," Ultramicroscopy 82, 33-38 (2000). [CrossRef] [PubMed]
  3. R. Eckert, J. M. Freyland, H. Gersen, H. Heinzelmann, G. Schürmann, W. Noell, U. Staufer, and N. F. de Rooij, "Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes," Appl. Phys. Lett. 77, 3695-3697 (2000). [CrossRef]
  4. G. Schürmann, W. Noell, U. Staufer, N. F. de Rooij, R. Eckert, J. M. Freyland, and H. Heinzelmann, "Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy," Appl. Opt. 40, 5040-5045 (2001). [CrossRef]
  5. J. L. Bohn, D. J. Nesbitt, and A. Gallagher, "Field enhancement in apertureless near-field scanning optical microscopy," J. Opt. Soc. Am. A 18, 2998-3006 (2001). [CrossRef]
  6. L. Aeschimann, T. Akiyama, U. Staufer, N. F. de Rooij, L. Thiery, R. Eckert, and H. Heinzelmann, "Characterization and fabrication of fully metal-coated scanning near-field optical microscopy SiO2 tips," J. Microsc. 209, 182-187 (2003). [CrossRef] [PubMed]
  7. R. Fikri, T. Grosges, and D. Barchiesi, "Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling," Opt. Lett. 28, 2147-2149 (2003). [CrossRef] [PubMed]
  8. S. Aubert, A. Bruyant, S. Blaize, R. Bachelot, G. Lerondel, S. Hudlet, and P. Royer, "Analysis of the interferometric effect of the background light in apertureless scanning near-field optical microscopy," J. Opt. Soc. Am. B 20, 2117-2124 (2003). [CrossRef]
  9. L. J. Richter, C. E. Jordan, R. R. Cavanagh, G. W. Bryant, A. Liu, S. J. Stranick, C. D. Keating, and M. J. Natan, "Influence of secondary tip shape on illumination-mode near-field scanning optical microscopy images," J. Opt. Soc. Am. A 16, 1936-1946 (1999). [CrossRef]
  10. W.-X. Sun and Z.-X. Shen, "Optimizing the near field around silver tips," J. Opt. Soc. Am. A 20, 2254-2259 (2003). [CrossRef]
  11. L. Vaccaro, L. Aeschimann, U. Staufer, H. P. Herzig, and R. Dändliker, "Propagation of the electromagnetic field in fully coated near-field optical probes," Appl. Phys. Lett. 83, 584-586 (2003). [CrossRef]
  12. E. Descrovi, L. Vaccaro, W. Nakagawa, L. Aeschimann, U. Staufer, and H. P. Herzig, "Collection of transverse and longitudinal fields by means of apertureless nanoprobes with different metal coating characteristics," Appl. Phys. Lett. 85, 5340-5342 (2004). [CrossRef]
  13. E. Descrovi, L. Vaccaro, L. Aeschimann, W. Nakagawa, U. Staufer, and H. P. Herzig, "Optical properties of microfabricated fully metal-coated near-field probes in collection mode," J. Opt. Soc. Am. A 22, 1432-1441 (2005). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited