We present a technique for efficiently computing the reflection and transmission of light by arbitrary systems of turbid layers. To approximate the steady-state reflectance and transmittance without the need to solve difficult boundary conditions, we convolve the reflectance and transmittance profiles of individual layers. We extend single-slab boundary conditions to handle index-of-refraction mismatches between turbid slabs and account for interlayer scattering by applying methods similar to Kubelka-Munk theory in frequency space. We demonstrate good agreement between the reflectance and the transmittance predicted by our model and numerical Monte Carlo methods and show that the far-source reflectance and transmittance of multilayered turbid materials are dominated by interlayer scattering.
© 2006 Optical Society of America
Medical Optics and Biotechnology
Original Manuscript: August 24, 2005
Manuscript Accepted: October 21, 2005
Vol. 1, Iss. 7 Virtual Journal for Biomedical Optics
Craig Donner and Henrik Wann Jensen, "Rapid simulation of steady-state spatially resolved reflectance and transmittance profiles of multilayered turbid materials," J. Opt. Soc. Am. A 23, 1382-1390 (2006)