Phase-shift estimation in sinusoidally illuminated images for lateral superresolution
JOSA A, Vol. 26, Issue 2, pp. 413-424 (2009)
http://dx.doi.org/10.1364/JOSAA.26.000413
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Abstract
Sinusoidally patterned illumination has been used to obtain lateral superresolution and axial sectioning in images. In both of these techniques multiple images are taken with the object illuminated by a sinusoidal pattern, the phase of the sinusoidal illumination being shifted differently in each image. The knowledge of these phase shifts is critical for image reconstruction. We discuss a method to estimate this phase shift with no prior knowledge of the shifts. In postprocessing we estimate randomly introduced, unknown phase shifts and process the images to obtain a superresolved image. Results of computer simulations are shown.
© 2009 Optical Society of America
OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(100.3020) Image processing : Image reconstruction-restoration
(100.6640) Image processing : Superresolution
(110.4850) Imaging systems : Optical transfer functions
(170.0180) Medical optics and biotechnology : Microscopy
ToC Category:
Image Processing
History
Original Manuscript: May 21, 2008
Manuscript Accepted: November 17, 2008
Published: January 30, 2009
Virtual Issues
Vol. 4, Iss. 4 Virtual Journal for Biomedical Optics
Citation
Sapna A. Shroff, James R. Fienup, and David R. Williams, "Phase-shift estimation in sinusoidally illuminated images for lateral superresolution," J. Opt. Soc. Am. A 26, 413-424 (2009)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=josaa-26-2-413
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