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Virtual Journal for Biomedical Optics


  • Editor: Gregory W. Faris
  • Vol. 2, Iss. 10 — Oct. 31, 2007

Effect of the incident angle on the electric near field of a conical probe for plane wave and Gaussian beam illumination

A. V. Goncharenko and Yia-Chung Chang  »View Author Affiliations

Optics Express, Vol. 15, Issue 18, pp. 11517-11529 (2007)

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We consider a simple analytical model for the electric near field of a semi-infinite conical probe and apply it to study the incident angle dependence of the field for the case of side illumination by both the plane wave and the Gaussian beam. The electric near field is shown to peak when approaching the grazing incidence. In some cases, a peak can also occur at an incident angle somewhat below 90°. The results obtained are in qualitative agreement with those for a thin semi-infinite wire and previously published results for the finite-size conical probes.

© 2007 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy

ToC Category:

Original Manuscript: April 30, 2007
Revised Manuscript: June 13, 2007
Manuscript Accepted: June 27, 2007
Published: August 27, 2007

Virtual Issues
Vol. 2, Iss. 10 Virtual Journal for Biomedical Optics

A. V. Goncharenko and Yia-Chung Chang, "Effect of the incident angle on the electric near field of a conical probe for plane wave and Gaussian beam illumination," Opt. Express 15, 11517-11529 (2007)

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