Interferometric resolution improvement for confocal microscopes
Optics Express, Vol. 15, Issue 19, pp. 12206-12216 (2007)
http://dx.doi.org/10.1364/OE.15.012206
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Abstract
We present a method for increasing the lateral resolution and detection efficiency of scanning fluorescence microscopes by adding an interferometer with partial image inversion to the detection pathway. We show that the resulting detection transfer function is essentially the absolute square of the system’s amplitude transfer function enlarged to twice its spatial frequency range. Simulations for a confocal system yield a lateral FWHM resolution of 168 nm (135 nm after image subtraction) as compared to 218 nm for confocal detection without an interferometer. Furthermore we demonstrate how this method is suitable for extended focus imaging. Here simulations for Bessel beam excitation and interferometric detection yield a resolution of 146 nm (116 nm after image subtraction) as compared to 199 nm for integrating detection without an interferometer.
© 2007 Optical Society of America
OCIS Codes
(110.0180) Imaging systems : Microscopy
(110.2970) Imaging systems : Image detection systems
(180.1790) Microscopy : Confocal microscopy
(180.3170) Microscopy : Interference microscopy
(180.5810) Microscopy : Scanning microscopy
(350.5730) Other areas of optics : Resolution
ToC Category:
Microscopy
History
Original Manuscript: June 15, 2007
Revised Manuscript: September 3, 2007
Manuscript Accepted: September 3, 2007
Published: September 11, 2007
Virtual Issues
Vol. 2, Iss. 10 Virtual Journal for Biomedical Optics
Citation
Kai Wicker and Rainer Heintzmann, "Interferometric resolution improvement for confocal microscopes," Opt. Express 15, 12206-12216 (2007)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=oe-15-19-12206
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