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Virtual Journal for Biomedical Optics

Virtual Journal for Biomedical Optics


  • Editor: Gregory W. Faris
  • Vol. 2, Iss. 10 — Oct. 31, 2007

Phase-sensitive silicon-based total internal reflection sensor

S. Patskovsky, M. Meunier, and A. V. Kabashin  »View Author Affiliations

Optics Express, Vol. 15, Issue 19, pp. 12523-12528 (2007)

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A concept of phase-sensitive Si-based Total Internal Reflection bio- and chemical sensor is presented. The sensor uses the reflection of light from an internal edge of a Si prism, which is in contact with analyte material changing its index of refraction (thickness). Changes of the refractive index are monitored by measuring the differential phase shift between p- and s- polarized components of light reflected from the system. We show that due to a high refractive index of Si, such methodology leads to a high sensitivity and dynamic range of measurements. Furthermore, the Si-based platform offers an easy bioimmobilization step and excellent opportunities for the development of multi-channel microsensors taking advantage of the advanced state of development of Si-based microfabrication technologies.

© 2007 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: August 1, 2007
Revised Manuscript: September 11, 2007
Manuscript Accepted: September 11, 2007
Published: September 14, 2007

Virtual Issues
Vol. 2, Iss. 10 Virtual Journal for Biomedical Optics

S. Patskovsky, M. Meunier, and A. V. Kabashin, "Phase-sensitive silicon-based total internal reflection sensor," Opt. Express 15, 12523-12528 (2007)

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