Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing
Optics Express, Vol. 17, Issue 13, pp. 10681-10687 (2009)
http://dx.doi.org/10.1364/OE.17.010681
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Abstract
We report a quantitative phase microscope based on spectral domain optical coherence tomography and line-field illumination. The line illumination allows self phase-referencing method to reject common-mode phase noise. The quantitative phase microscope also features a separate reference arm, permitting the use of high numerical aperture (NA > 1) microscope objectives for high resolution phase measurement at multiple points along the line of illumination. We demonstrate that the path-length sensitivity of the instrument can be as good as 41
© 2009 OSA
OCIS Codes
(120.3890) Instrumentation, measurement, and metrology : Medical optics instrumentation
(170.4500) Medical optics and biotechnology : Optical coherence tomography
(180.6900) Microscopy : Three-dimensional microscopy
ToC Category:
Medical Optics and Biotechnology
History
Original Manuscript: April 10, 2009
Revised Manuscript: May 16, 2009
Manuscript Accepted: May 26, 2009
Published: June 10, 2009
Virtual Issues
Vol. 4, Iss. 8 Virtual Journal for Biomedical Optics
Citation
Zahid Yaqoob, Wonshik Choi, Seungeun Oh, Niyom Lue, Yongkeun Park, Christopher Fang-Yen, Ramachandra R. Dasari, Kamran Badizadegan, and Michael S. Feld, "Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing," Opt. Express 17, 10681-10687 (2009)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=oe-17-13-10681
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