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Virtual Journal for Biomedical Optics

Virtual Journal for Biomedical Optics


  • Editors: Andrew Dunn and Anthony Durkin
  • Vol. 7, Iss. 1 — Jan. 4, 2012

3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing

K. Shao, A. Morisset, V. Pouget, E. Faraud, C. Larue, D. Lewis, and D. McMorrow  »View Author Affiliations

Optics Express, Vol. 19, Issue 23, pp. 22594-22599 (2011)

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We have performed three-dimensional characterization of the TPA effective laser spot size in silicon using an integrated knife-edge sensor. The TPA-induced response of a CMOS integrated circuit is analyzed based on these results and compared to simulation; we have found that the charge injection capacity in IC’s active layer could be influenced by irradiance energy and focus depth.

© 2011 OSA

OCIS Codes
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(190.4180) Nonlinear optics : Multiphoton processes
(180.4315) Microscopy : Nonlinear microscopy

ToC Category:
Nonlinear Absorption and Dispersion

Original Manuscript: September 6, 2011
Revised Manuscript: October 11, 2011
Manuscript Accepted: October 12, 2011
Published: October 25, 2011

Virtual Issues
Nonlinear Optics (2011) Optical Materials Express
Vol. 7, Iss. 1 Virtual Journal for Biomedical Optics

K. Shao, A. Morisset, V. Pouget, E. Faraud, C. Larue, D. Lewis, and D. McMorrow, "3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing," Opt. Express 19, 22594-22599 (2011)

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