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Self-interference fluorescence microscopy: three dimensional fluorescence imaging without depth scanning |
Optics Express, Vol. 20, Issue 14, pp. 15253-15262 (2012)
http://dx.doi.org/10.1364/OE.20.015253
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Abstract
We present a new method for high-resolution, three-dimensional fluorescence imaging. In contrast to beam-scanning confocal microscopy, where the laser focus must be scanned both laterally and axially to collect a volume, we obtain depth information without the necessity of depth scanning. In this method, the emitted fluorescence is collected in the backward direction and is sent through a phase plate that encodes the depth information into the phase of a spectrally resolved interference pattern. We demonstrate that decoding this phase information allows for depth localization accuracy better than 4 µm over a 500 µm depth-of-field. In a high numerical aperture configuration with a much smaller depth of field, a localization accuracy of tens of nanometers can be achieved. This approach is ideally suited for miniature endoscopes, where space limitations at the endoscope tip render depth scanning difficult. We illustrate the potential for 3D visualization of complex biological samples by constructing a three-dimensional volume of the microvasculature of ex vivo murine heart tissue from a single 2D scan.
© 2012 OSA
OCIS Codes
(170.1790) Medical optics and biotechnology : Confocal microscopy
(170.2520) Medical optics and biotechnology : Fluorescence microscopy
(170.6900) Medical optics and biotechnology : Three-dimensional microscopy
(110.3175) Imaging systems : Interferometric imaging
ToC Category:
Medical Optics and Biotechnology
History
Original Manuscript: April 12, 2012
Revised Manuscript: May 23, 2012
Manuscript Accepted: May 25, 2012
Published: June 22, 2012
Virtual Issues
Vol. 7, Iss. 9 Virtual Journal for Biomedical Optics
Citation
Mattijs de Groot, Conor L. Evans, and Johannes F. de Boer, "Self-interference fluorescence microscopy: three dimensional fluorescence imaging without depth scanning," Opt. Express 20, 15253-15262 (2012)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=oe-20-14-15253
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