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Surface plasmon microscopic sensing with beam profile modulation |
Optics Express, Vol. 20, Issue 27, pp. 28039-28048 (2012)
http://dx.doi.org/10.1364/OE.20.028039
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Abstract
Surface Plasmon microscopy enables measurement of local refractive index on a far finer scale than prism based systems. An interferometric or confocal system gives the so-called V(z) curve when the sample is scanned axially, which gives a measure of the surface plasmon propagation velocity. We show how a phase spatial light modulator (i) performs the necessary pupil function apodization (ii) imposes an angular varying phase shift that effectively changes sample defocus without any mechanical movement and (iii) changes the relative phase of the surface plasmon and reference beam to provide signal enhancement not possible with previous configurations.
© 2012 OSA
OCIS Codes
(060.4080) Fiber optics and optical communications : Modulation
(110.0110) Imaging systems : Imaging systems
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(180.0180) Microscopy : Microscopy
ToC Category:
Microscopy
History
Original Manuscript: October 4, 2012
Revised Manuscript: November 12, 2012
Manuscript Accepted: November 19, 2012
Published: December 3, 2012
Virtual Issues
Vol. 8, Iss. 1 Virtual Journal for Biomedical Optics
Citation
Bei Zhang, Suejit Pechprasarn, and Michael G. Somekh, "Surface plasmon microscopic sensing with beam profile modulation," Opt. Express 20, 28039-28048 (2012)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=oe-20-27-28039
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References
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