Full-field swept-source phase microscopy
Optics Letters, Vol. 31, Issue 10, pp. 1462-1464 (2006)
http://dx.doi.org/10.1364/OL.31.001462
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Abstract
We present a full-field phase microscopy technique for quantitative nanoscale surface profiling of samples in reflection. This technique utilizes swept-source optical coherence tomography in a full-field common path interferometer for phase-stable cross-sectional acquisition without scanning. Subwavelength variations in surface sample features are measured without interference from spurious reflections by processing the interferometric phase at a selected depth plane, providing a
© 2006 Optical Society of America
OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(180.3170) Microscopy : Interference microscopy
ToC Category:
Microscopy
History
Original Manuscript: January 10, 2006
Manuscript Accepted: January 13, 2006
Virtual Issues
Vol. 1, Iss. 6 Virtual Journal for Biomedical Optics
Citation
Marinko V. Sarunic, Seth Weinberg, and Joseph A. Izatt, "Full-field swept-source phase microscopy," Opt. Lett. 31, 1462-1464 (2006)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ol-31-10-1462
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