Abstract
We measure the nonlinear susceptibility of (BLT) thin films grown on quartz substrates using the Z-scan technique with picosecond laser pulses at a wavelength of . The third-order nonlinear refractive index coefficient γ and absorption coefficient β of the BLT thin film are and , respectively, which are much larger than those of most ferroelectric films. The results show that the BLT thin films on quartz substrates are good candidate materials for applications in nonlinear optical devices.
© 2007 Optical Society of America
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