Localized surface plasmon microscope with an illumination system employing a radially polarized zeroth-order Bessel beam
Optics Letters, Vol. 34, Issue 8, pp. 1180-1182 (2009)
http://dx.doi.org/10.1364/OL.34.001180
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Abstract
We propose an imaging principle that employs a radially polarized zeroth-order Bessel beam in the illlumination system of the localized surface plasmon microscope. The illumination system enables the microscope to visualize a refractive index distribution on a substrate fabricated in the Kretschmann configuration by the measurement of reflected intensity. The experimentally observed image of a particle reveals that the spatial resolution reaches the optical diffraction limit. The proposed principle can contribute to increase the imaging speed of localized surface plasmon microscopy by use of a beam scanning device.
© 2009 Optical Society of America
OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(240.6680) Optics at surfaces : Surface plasmons
ToC Category:
Optics at Surfaces
History
Original Manuscript: August 13, 2008
Revised Manuscript: February 23, 2009
Manuscript Accepted: February 27, 2009
Published: April 7, 2009
Virtual Issues
Vol. 4, Iss. 6 Virtual Journal for Biomedical Optics
Citation
Kouyou Watanabe, Goro Terakado, and Hiroshi Kano, "Localized surface plasmon microscope with an illumination system employing a radially polarized zeroth-order Bessel beam," Opt. Lett. 34, 1180-1182 (2009)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ol-34-8-1180
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