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Measurement of transport mean-free path of light in thin systems |
Optics Letters, Vol. 36, Issue 15, pp. 2824-2826 (2011)
http://dx.doi.org/10.1364/OL.36.002824
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Abstract
We extensively investigate in-plane light diffusion in systems with thicknesses larger than but comparable with the transport mean free path. By exploiting amplified spontaneous emission from dye molecules placed in the same holder of the sample, we obtain a directional probe beam precisely aligned to the sample plane. By comparing spatial intensity distribution of laterally leaking photons with predictions from random walk simulations, we extract accurate values of transport mean free path, opening the way to the investigation of a previously inaccessible kind of sample.
© 2011 Optical Society of America
OCIS Codes
(290.1990) Scattering : Diffusion
(290.4210) Scattering : Multiple scattering
(310.6860) Thin films : Thin films, optical properties
ToC Category:
Scattering
History
Original Manuscript: May 4, 2011
Revised Manuscript: June 14, 2011
Manuscript Accepted: June 20, 2011
Published: July 21, 2011
Virtual Issues
Vol. 6, Iss. 9 Virtual Journal for Biomedical Optics
Citation
Marco Leonetti and Cefe López, "Measurement of transport mean-free path of light in thin systems," Opt. Lett. 36, 2824-2826 (2011)
http://www.opticsinfobase.org/vjbo/abstract.cfm?URI=ol-36-15-2824
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