In this Letter, we describe an easy to implement technique to measure the spatial backscattering impulse-response at length scales shorter than a transport mean free path with resolution of better than 10 μm using the enhanced backscattering phenomenon. This technique enables spectroscopic measurements throughout the visible range and sensitivity to all polarization channels. Through a combination of Monte Carlo simulations and experimental measurements of latex microspheres, we explore the various sensitivities of our technique to both intrinsic sample properties and extrinsic instrumental properties. We conclude by demonstrating the extraordinary sensitivity of our technique to the shape of the scattering phase function, including higher order shape parameters than the anisotropy factor (or first moment).
© 2011 Optical Society of America
Original Manuscript: August 9, 2011
Revised Manuscript: October 25, 2011
Manuscript Accepted: November 2, 2011
Published: December 13, 2011
Vol. 7, Iss. 2 Virtual Journal for Biomedical Optics
Andrew J. Radosevich, Nikhil N. Mutyal, Vladimir Turzhitsky, Jeremy D. Rogers, Ji Yi, Allen Taflove, and Vadim Backman, "Measurement of the spatial backscattering impulse-response at short length scales with polarized enhanced backscattering," Opt. Lett. 36, 4737-4739 (2011)