Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Optical-force-induced artifacts in scanning probe microscopy

Not Accessible

Your library or personal account may give you access

Abstract

In the practice of near-field scanning probe microscopy, it is typically assumed that the distance regulation is independent of the optical signal. However, we demonstrate that these two signals are entangled due to the inherent action of optically induced force. This coupling leads to artifacts in both estimating the magnitude of optical fields and recording topographic maps.

©2011 Optical Society of America

Full Article  |  PDF Article
More Like This
Artifact reduction by intrinsic harmonics of tuning fork probe for scanning near-field optical microscopy

Zhaogang Dong, Ying Zhang, Shaw Wei Kok, Boon Ping Ng, and Yeng Chai Soh
Opt. Express 18(21) 22047-22060 (2010)

Discrimination of field components in optical probe microscopy

D. C. Kohlgraf-Owens, S. Sukhov, and A. Dogariu
Opt. Lett. 37(17) 3606-3608 (2012)

Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

C. H. van Hoorn, D. C. Chavan, B. Tiribilli, G. Margheri, A. J. G. Mank, F. Ariese, and D. Iannuzzi
Opt. Lett. 39(16) 4800-4803 (2014)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (2)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved