We demonstrate that the conventional optical signal in near-field scanning optical microscopy and the optical force induced topography contain complementary information about the complex three-dimensional field distribution. Crucially, the additional information about the field distribution can be retrieved without increasing the measurement complexity.
© 2012 Optical Society of America
Original Manuscript: June 15, 2012
Manuscript Accepted: July 9, 2012
Published: August 24, 2012
Vol. 7, Iss. 11 Virtual Journal for Biomedical Optics
D. C. Kohlgraf-Owens, S. Sukhov, and A. Dogariu, "Discrimination of field components in optical probe microscopy," Opt. Lett. 37, 3606-3608 (2012)