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Transient-grating self-referenced spectral interferometry for infrared femtosecond pulse characterization

J. Liu, F. J. Li, Y. L. Jiang, C. Li, Y. X. Leng, T. Kobayashi, R. X. Li, and Z. Z. Xu

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Abstract

We propose a technique for measuring infrared femtosecond pulses: transient-grating self-referenced spectral interferometry. Based on this technique, we built an extremely simple, alignment-free device and successfully characterized both 38 fs pulses at 800 nm and sub-two-cycle 10 fs pulses at 1.75 μm.

© 2012 Optical Society of America

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